XJP-403J

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XJP-403J

XJP-403J

This series microscope is widely used in observation & analysis of metallurgical organization in Mechanical industry, Research of Geological & Mineral department and viewing & measuring crystal, integrate circuit, micro-electronics, etc in Electronic industry. It is the first choice of Factories, Academy, Scientific research organization contrast image. Novel figure and superior craftsmanship keep abreast of the tidal current much more.
Humanized configuration design and simple operation, Let you release from the pressure of heavy work.

Specification			Model
			XJP-403J	XJP-403JT	XJP-403JA	XJP-403JAT
Viewing head	Compensation Free Binocular Head. Inclined at 45 ° ( 50mm -75mm )		●		●
	Compensation Free Trinocular Head. Inclined at 45 ° ( 50mm -75mm )			●		●
Eyepiece	WF10 × 20mm		●	●
	WF10 × 22mm				●	●
	WF10 × 20mm with reticule 0.1mm		●	●	●	●
Nosepiece	Quadruple nosepiece				●	●
	Quintuple nosepiece		●	●
Objective	195 metallurgical objectives	4 × 0.1W.D .25mm	●	●
		10 × 0.25W.D .11mm
		20 × 0.4W.D .9mm
		40 × 0.6W.D. 3.8mm
	Infinity metallurgical objectives	4 × 0.1W.D .25mm			●	●
		10 × 0.25W.D .12mm
		20 × 0.4W.D .10mm
		40 × 0.6W.D. 7.1mm
	50 × /0.75W.D. 1.9mm 80 × (S)/0.9W.D. 0.9mm		○	○	○	○
Stage	Double layers mechanical stage		●	●	●	●
	Stage size: 242mm × 172mm
	Central stage: Φ110mm
	Moving range: 75mm × 50mm
Focusing	Coaxial coarse&fine focusing adjustment with rack and pinion mechanism Fine focusing scaleValue 0.002mm		●	●	●	●
Illumination	Epi-Kohler illumination. With aperture iris diaphragm and field iris diaphragm. 12V/30W.AC85V-230V Adjustable brightness		●	●	●	●
Polarizing outfit	Analyzer rotatable 360 ° ,polarizer & Analyzer can be slided slided in / out of the optical path		●	●	●	●
Filter	Blue, green, yellow		●	●	●	●
Checking tool	0.01mm micrometer		●	●	●	●
Optional Accessory	1.3 or 3.0 Mega pixels CMOS electronic eyepiece
	Photography attachmrnt

Mark” ● ”standard outfit. Mark:” ○ ”optional parts.

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